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Which of the following equipment is based on the Bragg’s equation?
Question



Which of the following equipment is based on the Bragg’s equation?

A.

XRF

B.

XRD

C.

WD XRF

D.

AAS

Correct option is B


X-ray Diffraction (XRD) is a technique based on Bragg’s Law (nλ=2dsin⁡θn\lambda = 2d\sin\thetanλ=2dsinθ), which describes the condition for diffraction of X-rays by a crystalline material. The technique uses X-rays to study the structure of crystals by analyzing the angles and intensities of the diffracted beams.
Bragg’s Law Components:
· nnn: Order of reflection (an integer).
· λ\lambdaλ: Wavelength of the X-rays.
· ddd: Interplanar spacing of the crystal lattice.
· θ\thetaθ: Angle of incidence (and reflection).
Why XRD?
· XRD is specifically designed to analyze the arrangement of atoms in crystals, making it the most direct application of Bragg’s equation.
Why Not Other Options?
1. XRF (a):
· X-ray Fluorescence (XRF) measures elemental composition by detecting secondary X-rays emitted by a material when excited by primary X-rays. It is not based on diffraction or Bragg’s law.
2. WD XRF (c):
· Wavelength Dispersive XRF (WD XRF) is a specialized XRF technique that separates emitted X-rays based on their wavelength. While it involves wavelengths, it is not based on diffraction principles like XRD.
3. AAS (d):
· Atomic Absorption Spectroscopy (AAS) analyzes the absorption of light by atoms in a gaseous state. It does not involve X-ray diffraction or Bragg’s law.
Information Booster: 1. Applications of XRD:
· Determination of crystal structure.
· Identification of phases in a material.
· Analysis of interplanar spacing in crystalline substances.
2. Other Techniques and Their Applications:
· XRF: Elemental analysis in geological, environmental, and industrial samples.
· WD XRF: High-precision elemental analysis.
· AAS: Trace metal analysis in biological and environmental samples.
Additional Knowledge: XRD (b):
· Most accurate technique for determining the crystalline structure.
· Commonly used in mineralogy, materials science, and solid-state physics.
XRF (a) and WD XRF (c):
· Analyze elemental composition, unrelated to diffraction principles.
AAS (d):
· Focuses on measuring concentrations of specific elements in a sample.

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